|
SN74LVTH182504APM
|
TEXAS INSTRUMENTS
|
- |
BiCMOS |
|
Scan Test Device -40C to 85C 64-Pin LQFP Tray |
|
8.162 |
|
SN74LVTH18502APM
|
TEXAS INSTRUMENTS
|
- |
BiCMOS |
|
Scan Test Device -40C to 85C 64-Pin LQFP Tray |
|
15.343 |
|
PCA9560PW,112
|
NXP SEMICONDUCTORS
|
- |
Surface Mount |
|
Dual 5-bit multiplexed 1-bit latched I 2C EEPROM DIP switch -40C to 85C 20-Pin TSSOP Bulk |
|
1.8021 |
|
5962-9460102QXA
|
TEXAS INSTRUMENTS
|
- |
BiCMOS |
|
Scan Test Device |
|
243.6825 |
|
TMC2210J0V80
|
APTINA IMAGING
|
- |
|
|
Multiplier -55C to 125C |
|
7.3 |
|
74AHC1G4212GWH
|
NEXPERIA
|
- |
TSSOP |
|
12-stage divider and oscillator -40C to 125C 5-Pin TSSOP T/R |
|
0.4179 |
|
74AHC1G4214GWH
|
NEXPERIA
|
- |
-40C |
|
14-Stage Divider and Oscillator -40C to 125C 5-Pin TSSOP T/R |
|
0.3585 |
|
ZL30163GDG2
|
MICROCHIP TECHNOLOGY
|
- |
|
|
Clock Translator -40C to 85C 144-Pin LBGA Tray |
|
55.48 |
|
MAX24188ETK2
|
MICROCHIP TECHNOLOGY
|
- |
Surface Mount |
|
IEEE 1588 Clock -40C to 85C 68-Pin TQFN EP Tray |
|
28.9 |
|
PCA9641PWJ
|
NXP SEMICONDUCTORS
|
- |
TSSOP |
|
Demultiplexer -40C to 85C 16-Pin TSSOP T/R |
|
3.42 |
|
MC100EP445MNG
|
ON SEMICONDUCTOR
|
- |
Surface Mount |
|
Serial/Parallel Converter -40C to 85C 32-Pin QFN EP Tube |
|
33.78 |
|
SN74ABT18245ADL
|
NATIONAL SEMICONDUCTOR
|
- |
|
|
Scan Test Device -40C to 85C 56-Pin SSOP Tube |
|
15.459 |
|
74AHC1G4214GW-Q10H
|
NEXPERIA
|
- |
No |
|
14-Stage Divider and Oscillator -40C to 125C Automotive 5-Pin TSSOP |
|
0.3579 |
|
SN74ACT1073DW
|
NATIONAL SEMICONDUCTOR
|
- |
|
|
Bus Termination Array -40C to 85C 20-Pin SOIC Tube |
|
3.418 |
|
GS2965-INE3
|
SEMTECH INTERNATIONAL
|
- |
Surface Mount |
|
Reclocker -40C to 85C 32-Pin QFN EP |
|
51.74 |
|
SN74LVT8986PM
|
NATIONAL SEMICONDUCTOR
|
- |
|
|
Transceiver -40C to 85C 64-Pin LQFP Tray |
|
16.898 |
|
SN74ABT8652DL
|
NATIONAL SEMICONDUCTOR
|
- |
|
|
Scan Test Device |
|
16.499 |
|
SN74ACT8997DW
|
NATIONAL SEMICONDUCTOR
|
- |
|
|
Scan-Path Linker 0C to 70C 28-Pin SOIC Tube |
|
24.02 |
|
5962-9172501M3A
|
TEXAS INSTRUMENTS
|
- |
BiCMOS |
|
Scan Test Device |
|
131.438 |
|
MAX24288ETK2
|
MICROCHIP TECHNOLOGY
|
- |
|
|
IEEE 1588 Clock With Temperature Range from -40C to 85C |
|
40.5 |
|
5962-9172601M3A
|
TEXAS INSTRUMENTS
|
- |
BiCMOS |
|
Scan Test Device -40C to 85C 28-Pin CLLCC Tube |
|
119.6006 |
|
HMC794LP3E
|
ANALOG DEVICES
|
- |
Divider |
|
Divider -40C to 85C 16-Pin QFN EP T/R |
|
51.4564 |
|
NTE1192
|
NTE ELECTRONICS, INC.
|
- |
SIP |
|
VCO -30C to 75C 9-Pin SIP |
|
31.4 |
|
NTE1142
|
NTE ELECTRONICS, INC.
|
- |
No |
|
Decoder -10C to 75C |
|
30.52 |
|
NTE864
|
NTE ELECTRONICS, INC.
|
- |
70C |
|
Waveform Generator 0C to 70C 14-Pin PDIP |
|
82.68 |